Module 7
Design For Testability
Topics Covered
- Introduction to DFT and Need for Testing
- Manufacturing Defects in ICs
- Fault Models (Stuck-at, Transition, Path Delay)
- Scan Chain Concept & Architecture
- Scan Insertion Flow
- Scan Flip-Flops & Scan Modes
- ATPG (Automatic Test Pattern Generation) Basics
- Boundary Scan (JTAG)
- Built-In Self-Test (BIST) Overview
- Test Coverage Analysis
- DFT Checks & Reports
- Impact of DFT on Timing & Area
Module 7 – Study Material (Read Only)